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wmppaul's afm [3 articles]

当前文献位于 wmppaul's 文献库 标签分类为 afm. You can also see everyone's afm.
  • Analysis and optimization of force sensitivity in atomic force microscopy using optical and electrical detection
    Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures, Vol. 16, No. 1. (1998), pp. 43-50.
    by Francis Ho, Yoshihisa Yamamoto
    posted to afm_design afm by wmppaul on 2008-11-14 00:39:02 as **
  • Limits of force microscopy
    Review of Scientific Instruments, Vol. 66, No. 5. (1995), pp. 3191-3195.
    by DPE Smith
    posted to afm_design afm by wmppaul on 2008-11-14 00:36:50 as ** along with 1 person ewmoore
  • Simultaneous detection of translational and angular displacements of micromachined elements
    Applied Physics Letters, Vol. 91, No. 22. (2007)
    by ET Hwu, SK Hung, CW Yang, IS Hwang, KY Huang
    posted to afm by wmppaul on 2008-02-20 19:06:29 as read
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