Rheological Microscopy: Local Mechanical Properties from Microrheology

by: DT Chen, ER Weeks, JC Crocker, MF Islam, R Verma, J Gruber, AJ Levine, TC Lubensky, AG Yodh

Physical Review Letters, Vol. 90, No. 10. (14 March 2003), pp. 108301-108301.

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摘要

We demonstrate how tracer microrheology methods can be extended to study submicron scale variations in the viscoelastic response of soft materials; in particular; a semidilute solution of λ-DNA. The polymer concentration is depleted near the surfaces of the tracer particles; within a distance comparable to the polymer correlation length. The rheology of this microscopic layer alters the tracers’ motion and can be precisely quantified using one- and two-point microrheology. Interestingly; we found this mechanically distinct layer to be twice as thick as the layer of depleted concentration; likely due to solvent drainage through the locally perturbed polymer structure.

@article{chen03, abstract = {We demonstrate how tracer microrheology methods can be extended to study submicron scale variations in the viscoelastic response of soft materials; in particular; a semidilute solution of λ-DNA. The polymer concentration is depleted near the surfaces of the tracer particles; within a distance comparable to the polymer correlation length. The rheology of this microscopic layer alters the tracers’ motion and can be precisely quantified using one- and two-point microrheology. Interestingly; we found this mechanically distinct layer to be twice as thick as the layer of depleted concentration; likely due to solvent drainage through the locally perturbed polymer structure.}, author = {Chen, D. T. and Weeks, E. R. and Crocker, J. C. and Islam, M. F. and Verma, R. and Gruber, J. and Levine, A. J. and Lubensky, T. C. and Yodh, A. G. }, citeulike-article-id = {1676559}, doi = {http://dx.doi.org/10.1103/PhysRevLett.90.108301}, journal = {Physical Review Letters}, keywords = {depletion, microrheology, two-point}, month = {March}, number = {10}, pages = {108301}, posted-at = {2007-09-19 17:38:59}, priority = {0}, publisher = {American Physical Society}, title = {Rheological Microscopy: Local Mechanical Properties from Microrheology}, url = {http://dx.doi.org/10.1103/PhysRevLett.90.108301}, volume = {90}, year = {2003} }

RIS record

TY - JOUR ID - chen03 L3 - citeulike-article-id:1676559 N2 - We demonstrate how tracer microrheology methods can be extended to study submicron scale variations in the viscoelastic response of soft materials; in particular; a semidilute solution of λ-DNA. The polymer concentration is depleted near the surfaces of the tracer particles; within a distance comparable to the polymer correlation length. The rheology of this microscopic layer alters the tracers’ motion and can be precisely quantified using one- and two-point microrheology. Interestingly; we found this mechanically distinct layer to be twice as thick as the layer of depleted concentration; likely due to solvent drainage through the locally perturbed polymer structure. IS - 10 JF - Physical Review Letters EP - 108301 TI - Rheological Microscopy: Local Mechanical Properties from Microrheology PB - American Physical Society VL - 90 SP - 108301 KW - depletion KW - microrheology KW - two-point AU - Chen, DT AU - Weeks, ER AU - Crocker, JC AU - Islam, MF AU - Verma, R AU - Gruber, J AU - Levine, AJ AU - Lubensky, TC AU - Yodh, AG PY - 2003/03/14/ UR - http://dx.doi.org/10.1103/PhysRevLett.90.108301 ER -

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