Metrology, Inspection, and Process Control for Microlithography XIX, Vol. 5752, No. 1. (2005), pp. 237-247.
Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures, Vol. 16, No. 1. (1998), pp. 80-87.
Thin Solid Films, Vol. 468, No. 1-2. (1 December 2004), pp. 339-346.
Journal of Research of the National Bureau of Standards, Vol. 20 (April 1938), pp. 419-477.
Metrology, Inspection, and Process Control for Microlithography XVIII, Vol. 5375, No. 1. (2004), pp. 564-575.
Theory and Practice of Surface-Relief Diffraction Gratings: Synchrotron and Other Applications, Vol. 3450, No. 1. (1998), pp. 2-10.
Optics Letters, Vol. 2, No. 6. (1978), pp. 148-150.
Journal of the Optical Society of America A: Optics, Image Science, and Vision, Vol. 22, No. 2. (2005), pp. 230-238.
Journal of the Optical Society of America A: Optics, Image Science, and Vision, Vol. 19, No. 11. (2002), pp. 2194-2202.
Ultrasonic Imaging, Vol. 7, No. 3. (July 1985), pp. 264-275.
J. Opt. Soc. Am. A, Vol. 13, No. 4. (1 April 1996), 779.
J. Opt. Soc. Am. A, Vol. 12, No. 5. (1 May 1995), 1077.
J. Opt. Soc. Am. A, Vol. 24, No. 9. (2007), pp. 2692-2700.
International Journal of Thermophysics, Vol. 26, No. 5. (September 2005), pp. 1495-1514.
Science, Vol. 308, No. 5721. (22 April 2005), pp. 534-537.
Physical Review Letters, Vol. 85, No. 18. (30 October 2000), 3966.
Semiconductor Manufacturing, IEEE Transactions on, Vol. 14, No. 2. (2001), pp. 97-111.
(24 Mar 2006)
Review of Scientific Instruments, Vol. 44, No. 12. (1973), pp. 1753-1762.
SIGACT News, Vol. 27, No. 4. (December 1996), pp. 52-61.
Physical Review B (Solid State), Vol. 5, No. 12. (1972), pp. 4721-4729.
(27 June 2002)
Journal of the Optical Society of America A: Optics, Image Science, and Vision, Vol. 16, No. 12. (1999), pp. 2880-2886.
Applied Optics, Vol. 19, No. 4. (1980), pp. 525-533.
Physical Review Letters, Vol. 70, No. 10. (1993), pp. 1409-1412.
Optics Communications, Vol. 117, No. 1-2. (15 May 1995), pp. 16-19.
Journal of the Optical Society of America A: Optics, Image Science, and Vision, Vol. 20, No. 1. (2003), pp. 40-55.
Journal of the Optical Society of America A: Optics, Image Science, and Vision, Vol. 7, No. 3. (1990), pp. 394-411.
Acta Crystallographica Section A, Vol. 60, No. 2. (2004), pp. 134-141.
Physical Review, Vol. 56, No. 1. (1939), pp. 99-107.
Acoustics, Speech, and Signal Processing [see also IEEE Transactions on Signal Processing], IEEE Transactions on, Vol. 37, No. 12. (1989), pp. 2131-2147.
Proceedings of the IEEE, Vol. 71, No. 8. (1983), pp. 917-925.
Physical Review, Vol. 131, No. 6. (1963), pp. 2766-2788.
Proceedings of the Physical Society, Vol. 80, No. 6. (1962), pp. 1269-1272.
Reviews of Modern Physics, Vol. 37, No. 2. (1965), pp. 231-287.
Reports on Progress in Physics, Vol. 17, No. 1. (1954), pp. 35-100.
American Journal of Physics, Vol. 32, No. 12. (1964), pp. 919-926.
(01 January 1986)
Microwave Theory and Techniques, IEEE Transactions on, Vol. 32, No. 8. (1984), pp. 860-874.
Applied Optics, Vol. 41, No. 28. (2002), pp. 5951-5955.
Journal of the Optical Society of America A: Optics, Image Science, and Vision, Vol. 21, No. 11. (2004), pp. 2173-2179.
Journal of the Optical Society of America A: Optics, Image Science, and Vision, Vol. 22, No. 12. (2005), pp. 2651-2661.
Journal of the Optical Society of America A: Optics, Image Science, and Vision, Vol. 18, No. 9. (2001), pp. 2132-2137.
Circuits and Systems, IEEE Transactions on, Vol. 25, No. 9. (1978), pp. 694-702.
(29 October 1999)
(24 January 1997)
Ultrasonic Imaging, Vol. 4, No. 4. (October 1982), pp. 336-350.
SIAM Rev., Vol. 44, No. 2. (2002), pp. 169-224.
Proceedings of the Royal Society of London. Series A, Mathematical and Physical Sciences, Vol. 253, No. 1274. (1959), pp. 358-379.
Proceedings of the Royal Society of London. Series A, Mathematical and Physical Sciences, Vol. 253, No. 1274. (1959), pp. 349-357.