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eyliu's Azzam [2 articles]

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  • Photopolarimetric measurement of the Mueller matrix by Fourier analysis of a single detected signal
    Optics Letters, Vol. 2, No. 6. (1978), pp. 148-150.
    by RMA Azzam
    posted to metrology by eyliu on 2006-04-01 06:55:24 as ****
  • Polarization Characteristics of Scattered Radiation from a Diffraction Grating by Ellipsometry with Application to Surface Roughness
    Physical Review B (Solid State), Vol. 5, No. 12. (1972), pp. 4721-4729.
    by RMA Azzam, NM Bashara
    posted to diffraction gratings metrology by eyliu on 2006-03-13 22:14:32 as ***
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