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  • Tomographic microinterferometry of refractive index distribution
    Optical Micro- and Nanometrology in Manufacturing Technology, Vol. 5458, No. 1. (2004), pp. 52-63.
    by Pawel Kniazewski, Malgorzata Kujawinska, Heidi Ottevaere, Hugo Thienpont
    edited by Christophe Gorecki, Anand K Asundi
    posted to diffraction-tomography by eyliu on 2007-07-22 22:18:09 as **
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